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Defect and Microstructure Analysis by Diffraction

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This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.
Hardback
01-January-2000
$477.60
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'This book reviews the state of the art for determining the 'real' structure of matter' Zeitschrift Fur kristallographieThis book reviews the state of the art for determining the 'real' structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of 'mistakes' find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.
Product Details
ISBN-13
9780198501893
Publisher
Oxford University Press UK
Published
01-January-2000
Format
Hardback

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$477.60
Ships in 3-5 business days

Delivery estimate

Hurry up! Current stock:

Defect and Microstructure Analysis by Diffraction

$477.60

Description

'This book reviews the state of the art for determining the 'real' structure of matter' Zeitschrift Fur kristallographieThis book reviews the state of the art for determining the 'real' structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of 'mistakes' find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.