Trending Bestseller

Defect and Microstructure Analysis by Diffraction

No reviews yet Write a Review
This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.
Hardback
01-January-2000
RRP: $766.00
$526.00
Ships in 3-5 business days
Hurry up! Current stock:
'This book reviews the state of the art for determining the 'real' structure of matter' Zeitschrift Fur kristallographieThis book reviews the state of the art for determining the 'real' structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of 'mistakes' find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

This product hasn't received any reviews yet. Be the first to review this product!

RRP: $766.00
$526.00
Ships in 3-5 business days
Hurry up! Current stock:

Defect and Microstructure Analysis by Diffraction

RRP: $766.00
$526.00

Description

'This book reviews the state of the art for determining the 'real' structure of matter' Zeitschrift Fur kristallographieThis book reviews the state of the art for determining the 'real' structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of 'mistakes' find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

Customers Also Viewed