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Compact Modeling

Principles, Techniques and Applications

Gennady Gildenblat

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Paperback / softback
30 September 2014
$285.00
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Preface.Part I. Compact Models of MOS Transistors. 1. Surface-Ppotential-Based Compact Model of Bulk MOSFET. 2. PSP-SOI: A Surface-Potential-Based Compact Model of SOI MOSFETs. 3. Benchmark Tests for MOSFET Compact Models . 4. High-Voltage MOSFET Modeling. 5. Physics of Noise Performance of Nanoscale Bulk MOS Transistors.Part II Compact Models of Bipolar Junction Transistors. 6. Introduction to Bipolar Transistor Modeling. 7. Mextram. 8. The HiCuM Bipolar Transistor Model. Part III. Compact Models of Passive Devices. 9. Integrated Resistor Modeling. 10. The JUNCAP2 Model for Junction Diodes. 11. Surface-Potential-Based MOS Varactor Model. 12. Modeling of On-chip RF Passive Components. Part IV. Modeling of Multiple Gate MOSFETs. 13. Multi-Gate MOSFET Compact Model BSIM-MG. 14. Compact Modeling of Double-Gate and Nanowire MOSFETs.Part V. Statistical Modeling. 15. Modeling of MOS Matching. 16. Statistical Modeling Using Backward Propagation of Variance (BPV).Index.

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$285.00
Ships in 3-5 business days
Hurry up! Current stock:

Compact Modeling

$285.00

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Preface.Part I. Compact Models of MOS Transistors. 1. Surface-Ppotential-Based Compact Model of Bulk MOSFET. 2. PSP-SOI: A Surface-Potential-Based Compact Model of SOI MOSFETs. 3. Benchmark Tests for MOSFET Compact Models . 4. High-Voltage MOSFET Modeling. 5. Physics of Noise Performance of Nanoscale Bulk MOS Transistors.Part II Compact Models of Bipolar Junction Transistors. 6. Introduction to Bipolar Transistor Modeling. 7. Mextram. 8. The HiCuM Bipolar Transistor Model. Part III. Compact Models of Passive Devices. 9. Integrated Resistor Modeling. 10. The JUNCAP2 Model for Junction Diodes. 11. Surface-Potential-Based MOS Varactor Model. 12. Modeling of On-chip RF Passive Components. Part IV. Modeling of Multiple Gate MOSFETs. 13. Multi-Gate MOSFET Compact Model BSIM-MG. 14. Compact Modeling of Double-Gate and Nanowire MOSFETs.Part V. Statistical Modeling. 15. Modeling of MOS Matching. 16. Statistical Modeling Using Backward Propagation of Variance (BPV).Index.

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